Moin
Datacenter: rbx3
Rack: 43I03
Nummer: 351985
Festplatte: /dev/sdb (die zweite also)
Code:
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.10.9-xxxx-std-ipv6-64-rescue] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA DT01ACA100
Serial Number: 33647ZBNS
LU WWN Device Id: 5 000039 ff6c1ef70
Firmware Version: MS2OA750
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sat Sep 14 19:41:58 2013 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 7653) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 128) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 142 142 054 Pre-fail Offline - 71
3 Spin_Up_Time 0x0007 127 127 024 Pre-fail Always - 180 (Average 181)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 14
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 2
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 115 115 020 Pre-fail Offline - 34
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 1163
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 14
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 55
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 55
194 Temperature_Celsius 0x0002 142 142 000 Old_age Always - 42 (Min/Max 21/48)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 2
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 1
SMART Error Log Version: 1
ATA Error Count: 5
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5 occurred at disk power-on lifetime: 1163 hours (48 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 d2 76 66 3b 05 Error: ICRC, ABRT at LBA = 0x053b6676 = 87778934
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 00 00 48 79 3b 40 00 4d+03:27:16.371 WRITE FPDMA QUEUED
61 00 f0 48 dd 3b 40 00 4d+03:27:16.371 WRITE FPDMA QUEUED
61 00 e8 48 d9 3b 40 00 4d+03:27:16.371 WRITE FPDMA QUEUED
61 00 e0 48 d5 3b 40 00 4d+03:27:16.371 WRITE FPDMA QUEUED
61 00 d8 48 d1 3b 40 00 4d+03:27:16.371 WRITE FPDMA QUEUED
Error 4 occurred at disk power-on lifetime: 832 hours (34 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 80 80 34 89 00 Error: WP at LBA = 0x00893480 = 8991872
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 f0 40 2f ba 40 00 2d+20:16:37.431 WRITE FPDMA QUEUED
61 08 e8 48 2e ba 40 00 2d+20:16:37.431 WRITE FPDMA QUEUED
61 10 e0 88 2d ba 40 00 2d+20:16:37.431 WRITE FPDMA QUEUED
61 18 d8 38 2d ba 40 00 2d+20:16:37.431 WRITE FPDMA QUEUED
61 08 d0 28 2d ba 40 00 2d+20:16:37.431 WRITE FPDMA QUEUED
Error 3 occurred at disk power-on lifetime: 832 hours (34 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 78 08 28 89 00 Error: WP at LBA = 0x00892808 = 8988680
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 80 30 80 1b 89 40 00 2d+20:16:33.213 WRITE FPDMA QUEUED
61 80 28 00 0f 89 40 00 2d+20:16:33.213 WRITE FPDMA QUEUED
60 80 20 80 2a 89 40 00 2d+20:16:33.213 READ FPDMA QUEUED
60 00 18 80 26 89 40 00 2d+20:16:33.213 READ FPDMA QUEUED
60 00 10 80 22 89 40 00 2d+20:16:33.213 READ FPDMA QUEUED
Error 2 occurred at disk power-on lifetime: 832 hours (34 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 70 90 1b 89 00 Error: UNC at LBA = 0x00891b90 = 8985488
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 e8 80 13 89 40 00 2d+20:16:29.245 READ FPDMA QUEUED
60 80 e0 80 14 89 40 00 2d+20:16:29.245 READ FPDMA QUEUED
60 80 d8 00 1e 89 40 00 2d+20:16:29.245 READ FPDMA QUEUED
60 80 d0 80 12 89 40 00 2d+20:16:29.245 READ FPDMA QUEUED
60 80 c8 80 16 89 40 00 2d+20:16:29.245 READ FPDMA QUEUED
Error 1 occurred at disk power-on lifetime: 832 hours (34 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 68 18 0f 89 00 Error: UNC at LBA = 0x00890f18 = 8982296
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 10 00 1e 89 40 00 2d+20:16:25.451 READ FPDMA QUEUED
60 80 d8 80 1d 89 40 00 2d+20:16:25.451 READ FPDMA QUEUED
60 80 d0 00 1d 89 40 00 2d+20:16:25.451 READ FPDMA QUEUED
60 80 c8 80 1c 89 40 00 2d+20:16:25.451 READ FPDMA QUEUED
60 80 c0 00 1c 89 40 00 2d+20:16:25.450 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 90% 1115 8985488
# 2 Short offline Completed without error 00% 1115 -
# 3 Short offline Completed without error 00% 196 -
# 4 Short offline Completed without error 00% 190 -
# 5 Short offline Completed without error 00% 190 -
# 6 Short offline Completed without error 00% 179 -
# 7 Short offline Completed without error 00% 179 -
# 8 Short offline Completed without error 00% 83 -
# 9 Short offline Completed without error 00% 83 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Bitte die Platte austauschen
